February, 2005
[TC]² will present seminars focusing on RFID technologies, SizeUSA data analysis, and its 3D to 2D automatic pattern generation software at MAGIC, in the Las Vegas Convention Center , February 14-17,2005.
On Monday, February 14 th , “Better Fit, TODAY! - Implications from the SizeUSA National Sizing Survey” will provide an overview of the survey, which includes body measurement statistics on over 10,000 of the U.S. population divided into gender, six age ranges, and four ethnic groupings. An in-depth look at the 3D to 2D automatic pattern generation tool will be presented in a seminar entitled “Faster Fit, Automatically – 3D Body Data to 2D Patterns.” The 3D to 2D automatic pattern generation package converts 3D scan data into a flat pattern for slacks, and prepares slopers for skirts and blouses. This product is available as an extension of [TC]²'s 3D Body Measurement System software.
[TC]² will present “RFID – Fundamentals, Mandates, and Applications in Softgoods Today” on Tuesday, February 15 th . This session will discuss RFID hardware and software components, and how they combine to operate in today's business environment.
Seminars will be held in the South Hall, First Level. [TC]² will also have booth space in the Info Hub area of the Sourcing Zone. For more details on MAGIC, visit www.magiconline.com .
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